DocumentCode :
448013
Title :
Photoionization of trapped carriers in avalanche photodiodes to reduce afterpulsing during Geiger-mode photon counting
Author :
Krainak, Michael A.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Volume :
1
fYear :
2005
fDate :
22-27 May 2005
Firstpage :
588
Abstract :
We reduced the afterpulsing probability by a factor of five in a Geiger-mode photon-counting InGaAs avalanche photodiode by using sub-band-gap (λ=1.95 μm) laser diode illumination, which we believe photoionizes the trapped carriers.
Keywords :
III-V semiconductors; avalanche photodiodes; gallium arsenide; indium compounds; photoionisation; photon counting; semiconductor lasers; 1.95 micron; Geiger-mode photon counting; InGaAs; afterpulsing probability; avalanche photodiodes; photoionization; sub-band-gap laser diode illumination; trapped carriers; Avalanche photodiodes; Charge carrier processes; Detectors; Indium gallium arsenide; Ionization; Lighting; Optical filters; Photonic band gap; Photonics Society; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2005. (CLEO). Conference on
Print_ISBN :
1-55752-795-4
Type :
conf
DOI :
10.1109/CLEO.2005.201856
Filename :
1572922
Link To Document :
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