Title :
Determining thickness independently from optical constants using ultrafast spectral interferometry
Author :
Huang, Feng ; Federici, John F. ; Gary, Dale ; Jedju, Thomas ; Warren, Warren S.
Author_Institution :
Dept. of Phys., New Jersey Inst. of Technol., Newark, NJ, USA
Abstract :
We show that the application of ultrafast techniques, specially femtosecond lasers, allow simultaneous measurements of material thickness and optical constants from transmission measurements using a frequency interferometer.
Keywords :
high-speed optical techniques; light interferometry; measurement by laser beam; optical constants; thickness measurement; femtosecond lasers; frequency interferometer; material thickness measurement; optical constants; transmission measurements; ultrafast spectral interferometry; ultrafast technique; Beams; Optical interferometry; Optical materials; Optical pulses; Optical receivers; Optical refraction; Pulse measurements; Signal analysis; Thickness measurement; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 2005. (CLEO). Conference on
Print_ISBN :
1-55752-795-4
DOI :
10.1109/CLEO.2005.202038
