Title :
Combination of AFM with IR-ATR spectroscopy for measurements in liquid environment
Author :
Brucherseifer, Martin ; Kranz, Christine ; Mizaikoff, Boris
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
We present the instrumental combination of atomic force microscopy with infrared attenuated total reflectance spectroscopy. This is the first time to demonstrate AFM scanning while recording IR-spectra in a liquid environment.
Keywords :
atomic force microscopy; attenuated total reflection; infrared spectra; liquid structure; AFM; IR-ATR spectroscopy; IR-spectra; atomic force microscopy; infrared attenuated total reflectance spectroscopy; instrumental combination; liquid environment; Atomic force microscopy; Atomic measurements; Force measurement; Infrared spectra; Optical attenuators; Optical microscopy; Optical reflection; Optical sensors; Optical surface waves; Spectroscopy;
Conference_Titel :
Lasers and Electro-Optics, 2005. (CLEO). Conference on
Print_ISBN :
1-55752-795-4
DOI :
10.1109/CLEO.2005.202125
