• DocumentCode
    449206
  • Title

    Evaluation of phase shift in a Si-waveguide with a ferroelectric liquid crystal cladding using Mach-Zehnder interferometer

  • Author

    Nakatsuhara, K. ; Inami, Y. ; Nakagami, T.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Kanagawa Inst. of Technol., Japan
  • Volume
    3
  • fYear
    2005
  • fDate
    25-29 Sept. 2005
  • Firstpage
    607
  • Abstract
    We fabricated a Mach-Zehnder interferometer with FLC-clad waveguides on a silicon-on-insulator wafer and evaluated the phase shift due to the FLC at a wavelength of 1550 nm. The evaluated shift difference was 0.45 n/mm.
  • Keywords
    Mach-Zehnder interferometers; claddings; elemental semiconductors; ferroelectric liquid crystals; optical fabrication; optical waveguides; rib waveguides; silicon; silicon-on-insulator; 1550 nm; Mach-Zehnder interferometer; Si-waveguide; ferroelectric liquid crystal cladding; phase shift; silicon-on-insulator wafer;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Optical Communication, 2005. ECOC 2005. 31st European Conference on
  • Conference_Location
    IET
  • ISSN
    0537-9989
  • Print_ISBN
    0-86341-543-1
  • Type

    conf

  • Filename
    1576409
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=449206