Title :
Evaluation of phase shift in a Si-waveguide with a ferroelectric liquid crystal cladding using Mach-Zehnder interferometer
Author :
Nakatsuhara, K. ; Inami, Y. ; Nakagami, T.
Author_Institution :
Dept. of Electr. & Electron. Eng., Kanagawa Inst. of Technol., Japan
Abstract :
We fabricated a Mach-Zehnder interferometer with FLC-clad waveguides on a silicon-on-insulator wafer and evaluated the phase shift due to the FLC at a wavelength of 1550 nm. The evaluated shift difference was 0.45 n/mm.
Keywords :
Mach-Zehnder interferometers; claddings; elemental semiconductors; ferroelectric liquid crystals; optical fabrication; optical waveguides; rib waveguides; silicon; silicon-on-insulator; 1550 nm; Mach-Zehnder interferometer; Si-waveguide; ferroelectric liquid crystal cladding; phase shift; silicon-on-insulator wafer;
Conference_Titel :
Optical Communication, 2005. ECOC 2005. 31st European Conference on
Conference_Location :
IET
Print_ISBN :
0-86341-543-1
