Phase noise analysis for ICI self-cancellation coded OFDM with short-channel synchronization devices

Phase noise is the major cause of performance degradation in OFDM systems. Hot carriers (HCs), found in the CMOS-based synchronization circuits, are high-mobility charge carriers that affect the MOSFETs´ stability by increasing the required operating threshold voltages. The HC effect manifests itself as the phase noise, which increases with the continued MOSFET operation and results in the performance degradation of the voltage-controlled oscillator (VCO) built on the MOSFETs. The MOSFET instability impacts on the OFDM system performance, by inducing intercarrier interference (ICI) and common phase error (CPE) on the subcarriers. In this paper, we evaluate the effect of ICI self-cancellation coding on the phase noise induced by the hot-carrier effect in OFDM systems.