Title :
Sensitivity Analysis and Modeling of Symmetric Minor Hysteresis Loops Using the GRUCAD Description
Author :
Steentjes, Simon ; Chwastek, Krzysztof ; Petrun, Martin ; Dolinar, Drago ; Hameyer, Kay
Author_Institution :
Inst. of Electr. Machines, RWTH Aachen Univ., Aachen, Germany
Abstract :
This paper presents a predictive and easily implementable hysteresis model for ferromagnetic laminations subjected to various quasi-static magnetic loads. In this model, the description of magnetic hysteresis is based on the decoupling of the magnetic field strength in a reversible and irreversible part, unlike in the Jiles-Atherton model. Thereby, the source of problems originating in the assumption that total magnetization could be split into the reversible and the irreversible component is bypassed. It should be stressed that models based on field separation principles are consistent with the laws of thermodynamics. The presented model allows for a systematic parameter identification based on standard magnetic measurements. In this paper, the variation of model parameters on the shape of the modeled hysteresis loop is presented. Furthermore, parameter identified from the major loop are applied to model symmetric minor loops that are evaluated by comparison with measurements. The structure of the model enables an inclusion of eddy-current effects, and is ready for a further exploitation in the FE modeling of macroscopic devices.
Keywords :
eddy currents; finite element analysis; magnetic hysteresis; parameter estimation; thermodynamics; GRUCAD description; eddy-current effects; finite element modeling; magnetic field decoupling; magnetic field strength; magnetization; sensitivity analysis; symmetric minor hysteresis loops; systematic parameter identification; thermodynamics; Computational modeling; Equations; Magnetic hysteresis; Mathematical model; Numerical models; Solid modeling; Steel; Electrical steel sheets; energy conservation; magnetic hysteresis; magnetic material modeling; minor loops;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2014.2323250