Title :
BER analysis of BPSK signaling in Ricean-faded cochannel interference
Author :
Du, Zheng ; Cheng, Julian ; Beaulieu, Norman C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
fDate :
28 Nov.-2 Dec. 2005
Abstract :
The bit error rate of a binary phase shift keying signal in Ricean-faded cochannel interference is studied. A precise bit error rate expression based on a characteristic function method is derived for a bandlimited binary phase shift keying signal corrupted by an arbitrary number of asynchronous Ricean-faded interfering signals. For the special case when there is one synchronous Ricean-faded interfering signal, a Chernoff bound analysis is performed and it predicts that the error floor of the desired user signal decreases with an increase of the Rice factor in the interfering user´s fading channel. However, our precise bit error rate analysis results reveal that the opposite phenomenon can also happen, in particular when the signal-to-interference power ratio is low. A saddle-point approximation based error rate analysis is also provided. It is shown that this approximation is highly accurate. An asymptotic analysis based on the saddle-point approximation further reveals that a minimum signal-to-interference power ratio is required to have the desired user´s error rate performance improved by a less-faded interfering signal.
Keywords :
binary codes; cellular radio; cochannel interference; error statistics; fading channels; phase shift keying; BER analysis; BPSK signaling; Chernoff bound analysis; Ricean-faded cochannel interference; asymptotic analysis; bandlimited binary phase shift keying signal; bit error rate analysis; characteristic function method; saddle-point approximation; signal-to-interference power ratio; Binary phase shift keying; Bit error rate; Error analysis; Fading; Interchannel interference; Nakagami distribution; Performance analysis; Phase shift keying; Rayleigh channels; Signal analysis;
Conference_Titel :
Global Telecommunications Conference, 2005. GLOBECOM '05. IEEE
Print_ISBN :
0-7803-9414-3
DOI :
10.1109/GLOCOM.2005.1577845