• DocumentCode
    45006
  • Title

    A 100 fps, Time-Correlated Single-Photon-Counting-Based Fluorescence-Lifetime Imager in 130 nm CMOS

  • Author

    Field, Ryan M. ; Realov, Simeon ; Shepard, Kenneth L.

  • Author_Institution
    Intel Corp., Santa Clara, CA, USA
  • Volume
    49
  • Issue
    4
  • fYear
    2014
  • fDate
    Apr-14
  • Firstpage
    867
  • Lastpage
    880
  • Abstract
    A fully-integrated single-photon avalanche diode (SPAD) and time-to-digital converter (TDC) array for high-speed fluorescence lifetime imaging microscopy (FLIM) in standard 130 nm CMOS is presented. This imager is comprised of an array of 64-by-64 SPADs each with an independent TDC for performing time-correlated single-photon counting (TCSPC) at each pixel. The TDCs use a delay-locked-loop-based architecture and achieve a 62.5 ps resolution with up to a 64 ns range. A data-compression datapath is designed to transfer TDC data to off-chip buffers, which can support a data rate of up to 42 Gbps. These features, combined with a system implementation that leverages a x4 PCIe-cabled interface, allow for demonstrated FLIM imaging rates at up to 100 frames per second.
  • Keywords
    CMOS image sensors; avalanche diodes; data compression; delay lock loops; fluorescence; photon counting; sensor arrays; time-digital conversion; CMOS standard; FLIM; PCIe-cabled interface; SPAD; TCSPC; TDC array; data-compression datapath; delay-locked-loop-based architecture; fully-integrated single-photon avalanche diode; high-speed fluorescence lifetime imaging microscopy; off-chip buffer; size 130 nm; time-correlated single-photon-counting-based fluorescence-lifetime imager; time-to-digital converter array; Arrays; CMOS integrated circuits; Clocks; Imaging; Logic gates; Measurement by laser beam; Photonics; Fluorescence lifetime imaging microscopy (FLIM); imaging; single-photon avalanche diodes (SPADs); time-correlated single-photon counting (TCSPC); time-to-digital converter (TDC);
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2013.2293777
  • Filename
    6698400