Title :
A 100 fps, Time-Correlated Single-Photon-Counting-Based Fluorescence-Lifetime Imager in 130 nm CMOS
Author :
Field, Ryan M. ; Realov, Simeon ; Shepard, Kenneth L.
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
A fully-integrated single-photon avalanche diode (SPAD) and time-to-digital converter (TDC) array for high-speed fluorescence lifetime imaging microscopy (FLIM) in standard 130 nm CMOS is presented. This imager is comprised of an array of 64-by-64 SPADs each with an independent TDC for performing time-correlated single-photon counting (TCSPC) at each pixel. The TDCs use a delay-locked-loop-based architecture and achieve a 62.5 ps resolution with up to a 64 ns range. A data-compression datapath is designed to transfer TDC data to off-chip buffers, which can support a data rate of up to 42 Gbps. These features, combined with a system implementation that leverages a x4 PCIe-cabled interface, allow for demonstrated FLIM imaging rates at up to 100 frames per second.
Keywords :
CMOS image sensors; avalanche diodes; data compression; delay lock loops; fluorescence; photon counting; sensor arrays; time-digital conversion; CMOS standard; FLIM; PCIe-cabled interface; SPAD; TCSPC; TDC array; data-compression datapath; delay-locked-loop-based architecture; fully-integrated single-photon avalanche diode; high-speed fluorescence lifetime imaging microscopy; off-chip buffer; size 130 nm; time-correlated single-photon-counting-based fluorescence-lifetime imager; time-to-digital converter array; Arrays; CMOS integrated circuits; Clocks; Imaging; Logic gates; Measurement by laser beam; Photonics; Fluorescence lifetime imaging microscopy (FLIM); imaging; single-photon avalanche diodes (SPADs); time-correlated single-photon counting (TCSPC); time-to-digital converter (TDC);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2013.2293777