DocumentCode :
45027
Title :
A Supply-Noise Sensitivity Tracking PLL in 32 nm SOI Featuring a Deep Trench Capacitor Based Loop Filter
Author :
Bongjin Kim ; Weichao Xu ; Kim, Chul Han
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
Volume :
49
Issue :
4
fYear :
2014
fDate :
Apr-14
Firstpage :
1017
Lastpage :
1026
Abstract :
An adaptive PLL that maximizes the timing compensation between clock and data, commonly referred to as the clock data compensation effect, is demonstrated in 32 nm SOI. A number of previous adaptive PLL designs have successfully proven that processor operating speed can be improved by modulating the clock path delay or the PLL output clock period using the resonant supply noise. In this work, we take the adaptive PLL concept one step further by achieving optimal clock data compensation across a wide range of PVT and operating conditions. This was accomplished by an automated supply-noise sensitivity tracking loop which constantly monitors any timing errors occurring in a critical path replica circuit. Compared to a conventional PLL, the proposed design achieves up to a 15.6% improvement in processor Fmax or a 9.8% reduced dynamic power consumption under an iso-operating frequency for a realistic supply noise. Additionally, a 92.1% reduction in PLL area was achieved by employing ultra-high density deep trench capacitors in the loop filter.
Keywords :
capacitors; clocks; compensation; filters; phase locked loops; power consumption; silicon-on-insulator; timing circuits; PVT; SOI; Si; adaptive PLL; automated supply-noise sensitivity; clock data compensation effect; critical path replica circuit; deep trench capacitor; dynamic power consumption; iso-operating frequency; loop filter; operating conditions; processor Fmax; realistic supply noise; size 32 nm; supply-noise sensitivity tracking PLL; timing compensation; timing errors; Capacitors; Clocks; Delays; Noise; Phase locked loops; Sensitivity; Tracking loops; Resonant supply noise; adaptive PLL; clock data compensation; deep trench capacitor;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2013.2294323
Filename :
6698402
Link To Document :
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