DocumentCode
450391
Title
Digital Test Generation and Design for Testability
Author
Grason, John ; Nagle, Andrew W.
Author_Institution
Bell Laboratories, Holmdel, NJ
fYear
1980
fDate
23-25 June 1980
Firstpage
175
Lastpage
189
Abstract
This paper is a tutorial intended primarily for individuals just getting started in digital testing. Basic concepts of testing are described, and the steps in the test development process are discussed. A pragmatic approach to test sequence generation is presented, oriented towards ICs interconnected on a board. Finally, design for testability techniques are described, with an emphasis on solving problems that appeared during the test generation discussion.
Keywords
Circuit faults; Circuit testing; Design for testability; Digital circuits; Employee welfare; Integrated circuit interconnections; Logic design; Manufacturing processes; Permission; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1980. 17th Conference on
Print_ISBN
0-89791-020-6
Type
conf
DOI
10.1109/DAC.1980.1585244
Filename
1585244
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