Title :
Digital Test Generation and Design for Testability
Author :
Grason, John ; Nagle, Andrew W.
Author_Institution :
Bell Laboratories, Holmdel, NJ
Abstract :
This paper is a tutorial intended primarily for individuals just getting started in digital testing. Basic concepts of testing are described, and the steps in the test development process are discussed. A pragmatic approach to test sequence generation is presented, oriented towards ICs interconnected on a board. Finally, design for testability techniques are described, with an emphasis on solving problems that appeared during the test generation discussion.
Keywords :
Circuit faults; Circuit testing; Design for testability; Digital circuits; Employee welfare; Integrated circuit interconnections; Logic design; Manufacturing processes; Permission; System testing;
Conference_Titel :
Design Automation, 1980. 17th Conference on
Print_ISBN :
0-89791-020-6
DOI :
10.1109/DAC.1980.1585244
