Title :
SCOAP: Sandia Controllability/Observability Analysis Program
Author :
Goldstein, Lawrence H. ; Thigpen, Evelyn L.
Author_Institution :
Sandia National Laboratories, Albuquerque, NM
Abstract :
SCOAP is a program developed at Sandia National Laboratories for the analysis of digital circuit testability. Testability is related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs, respectively. This paper reviews the testability analysis algorithms and describes their implementation in the SCOAP program.
Keywords :
Algorithm design and analysis; Circuit faults; Circuit testing; Controllability; Costs; Design for testability; Digital circuits; Laboratories; Logic testing; Observability;
Conference_Titel :
Design Automation, 1980. 17th Conference on
Print_ISBN :
0-89791-020-6
DOI :
10.1109/DAC.1980.1585245
