DocumentCode :
450452
Title :
A Fast Signature Simulation Tool for Built-In Self-Testing Circuits
Author :
Tan, S.B. ; Totton, K. ; Baker, K. ; Varma, P. ; Porter, R.
Author_Institution :
GEC Research Limited, Hirst Research Centre, Wembley, Middlesex, United Kingdom
fYear :
1987
fDate :
28-1 June 1987
Firstpage :
17
Lastpage :
25
Abstract :
This paper describes a Fast Signature Simulator (FSS) tool for Built-In Self-Testing (BIST) circuits. The FSS consists of a simulator generator and a compiled code simulator. The simulator generator comprises a controlling program called the EXECUTIVE and translation software called SIM-GEN. SIM-GEN accepts a Hardware Description Language (HDL) representation of the circuit-under-test as its input and produces C code simulation modules comprising Boolean relations that represent the structure of the circuit. These C code modules are then compiled and linked together to form the basis of the compiled code simulator. Simulation is invoked by executing the compiled C code description of the circuit. The simulation time is minimised by the use of parallel simulation techniques in conjunction with efficient functional models and novel mapping techniques for the LFSRs. Performances approaching 5 Million Gate Evaluations Per Second (GEPS) have been achieved using the FSS.
Keywords :
Automatic testing; Built-in self-test; Circuit simulation; Circuit testing; Computational modeling; Costs; Frequency selective surfaces; Materials testing; Performance evaluation; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1987. 24th Conference on
ISSN :
0738-100X
Print_ISBN :
0-8186-0781-5
Type :
conf
DOI :
10.1109/DAC.1987.203216
Filename :
1586200
Link To Document :
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