Title :
Functional Abstraction from Structure in VLSI Simulation Models
Author :
Lathrop, R.H. ; Hall, R.J. ; Kirk, R.S.
Keywords :
Kirk field collapse effect; Very large scale integration;
Conference_Titel :
Design Automation, 1987. 24th Conference on
Print_ISBN :
0-8186-0781-5
DOI :
10.1109/DAC.1987.203241
