Title :
Parallel Pattern Fault Simulation of Path Delay Faults
Author :
Schulz, Michael H. ; Fink, Franz ; Fuchs, Karl
Author_Institution :
Institute of Computer Aided Design, Department of Electrical Engineering, Technical University of Munich, Munich, West Germany
Abstract :
This paper presents an accelerated fault simulation approach for path delay faults. The distinct features of the proposed fault simulation method consist in the application of parallel processing of patterns at all stages of the calculation procedure, its versatility to account for both robust and non-robust detection of path delay faults, and its capability of efficiently maintaining large numbers of path faults to be simulated.
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Delay; Fault detection; Logic testing; Parallel processing; Permission; Timing;
Conference_Titel :
Design Automation, 1989. 26th Conference on
Print_ISBN :
0-89791-310-8
DOI :
10.1109/DAC.1989.203423