Title :
Laser simulation of single event effects in electronics
Abstract :
A collection of slides from the author´s seminar presentation is given
Keywords :
laser beam effects; radiation hardening (electronics); MBDA radiation effects laser system; depth sensitivity; electronics; laser simulation; memory mapping; multiple bit upset; single event effects; threshold mapping; two photon technique;
Conference_Titel :
Cosmic Radiation Single Event Effects and Avionics, 2005. The IEE Seminar on (Ref. No. 2005/11270)
Conference_Location :
London
Print_ISBN :
0-86341-600-4
