Title :
Initial performance of the two-dimensional 4096-channel amplifier array
Author :
Ikeda, H. ; Hiruta, T. ; Tamura, K. ; Nakazawa, K. ; Takashima, T. ; Takahashi, T. ; Kiyuna, T. ; Yamamoto, M. ; Ohno, R.
Author_Institution :
ISAS, Kanagawa, Japan
Abstract :
The two-dimensional 4096-channel amplifier array presented here was developed for a specific use in an area of X-ray astronomy. The amplifier array consists of a charge sensitive preamplifier, shaping amplifier, peak-hold circuit and analog multiplexor circuit together with a test-pulse circuit, analog-monitor circuit and digital-control circuit. The amplifier array was fabricated using a 0.25-μm CMOS process of TSMC with options such as five-metal, double-poly, deep N-well and medium VT. The pixel circuit accommodates in the area of 200 μm by 200 μm with a power consumption of 150 μW per channel. The power rails employed are ±1.25 V. The entire chip size is 16 mm by 16 mm, which accommodates the 4096 channels of the amplifier array. The noise level targeted is 1 keV (FWHM) with an appropriate CdTe pixel X-ray detector. In order to maintain the low-noise characteristics, special care was taken in the reinforcement of the power-supply rejection ratio, configuration of the bias circuit, elimination of D-to-A interference and even to eliminate the minor noise associated with the shaping amplifier. Eventually electronic noise was suppressed down to 100 electrons (rms) or less for a CdTe pixel X-ray detector. The other issue concerns the pixel-wise checkout of the amplifier array. The analog-monitor circuit multiplexes the preamplifier output, shaping-amplifier output and some subsidiary test points to be externally observed, and, then, every amplifier channel can be examined over the entire chip. The circuit design proceeded under the Open-IP project organized by ISAS, JAXA, with cooperation by related universities and research organizations.
Keywords :
CMOS integrated circuits; X-ray apparatus; analogue circuits; position sensitive particle detectors; preamplifiers; pulse circuits; semiconductor counters; -1.25 V; 0.25 mum; 1 keV; 1.25 V; 150 muW; 16 mm; 200 mum; CMOS; CdTe pixel X-ray detector; Open-IP project; TSMC; X-ray astronomy; analog multiplexor circuit; analog-monitor circuit; bias circuit; charge sensitive preamplifier; digital-control circuit; digital-to-analog interference; electronic noise; noise level; peak-hold circuit; pixel circuit; power-supply rejection ratio; shaping amplifier; test-pulse circuit; two-dimensional 4096-channel amplifier array; Astronomy; CMOS process; Circuit noise; Circuit testing; Energy consumption; Multi-stage noise shaping; Power amplifiers; Preamplifiers; Rails; X-ray detectors;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Print_ISBN :
0-7803-9221-3
DOI :
10.1109/NSSMIC.2005.1596274