DocumentCode
451471
Title
A 12-channel CMOS preamplifier-shaper-discriminator ASIC for APD and gas counters
Author
Yeom, J.Y. ; Defendi, I. ; Takahashi, H. ; Zeitelhack, K. ; Nakazawa, M. ; Murayama, H.
Author_Institution
Dept. of Quantum Eng. & Syst. Sci., Tokyo Univ., Japan
Volume
1
fYear
2005
fDate
23-29 Oct. 2005
Firstpage
391
Lastpage
393
Abstract
A 12-channel (Ch) CMOS preamplifier-shaper-discriminator ASIC designed for avalanche photodiode (APD) and gas counter readout has been fabricated on a 2.4 mm×2.4 mm die area using ROHM 0.35 μ CMOS technology. This mixed signal ASIC consists of both analog and digital devices and a window type discriminator is easily implemented through the use of a digital encoder to encode outputs from two comparators. The charge sensitive preamplifier which is based on gain-boosted (regulated) cascode topology has been tested to have a low optimum equivalent noise charge (ENC) of about 900 e-+75 e-/pF FWHM at a shaping time of 0.5 μs and the gain (voltage output to charge input) is 0.9/pF. The gain of the shaper is about 2.5/pF and the shaping time can be varied slightly from an external pin. This chip is capable of sensing bipolar signals and is linear at least up to 320 fC for negative charge and 150 fC for positive charge. The average ENC of each channel has been calculated to be about 1600 e-+80 e-/pF FWHM. Finally, the power consumption of the chip was approximately 0.13 W.
Keywords
CMOS integrated circuits; avalanche photodiodes; mixed analogue-digital integrated circuits; nuclear electronics; particle detectors; preamplifiers; readout electronics; 0.5 mus; 12-channel CMOS preamplifier-shaper-discriminator ASIC; 2 mm; ROHM CMOS; avalanche photodiode; bipolar signals; charge sensitive preamplifier; digital encoder; equivalent noise charge; gain-boosted regulated cascode topology; gas counter readout; window type discriminator; Application specific integrated circuits; Avalanche photodiodes; CMOS technology; Counting circuits; Energy consumption; Noise shaping; Preamplifiers; Testing; Topology; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2005 IEEE
ISSN
1095-7863
Print_ISBN
0-7803-9221-3
Type
conf
DOI
10.1109/NSSMIC.2005.1596277
Filename
1596277
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