• DocumentCode
    451471
  • Title

    A 12-channel CMOS preamplifier-shaper-discriminator ASIC for APD and gas counters

  • Author

    Yeom, J.Y. ; Defendi, I. ; Takahashi, H. ; Zeitelhack, K. ; Nakazawa, M. ; Murayama, H.

  • Author_Institution
    Dept. of Quantum Eng. & Syst. Sci., Tokyo Univ., Japan
  • Volume
    1
  • fYear
    2005
  • fDate
    23-29 Oct. 2005
  • Firstpage
    391
  • Lastpage
    393
  • Abstract
    A 12-channel (Ch) CMOS preamplifier-shaper-discriminator ASIC designed for avalanche photodiode (APD) and gas counter readout has been fabricated on a 2.4 mm×2.4 mm die area using ROHM 0.35 μ CMOS technology. This mixed signal ASIC consists of both analog and digital devices and a window type discriminator is easily implemented through the use of a digital encoder to encode outputs from two comparators. The charge sensitive preamplifier which is based on gain-boosted (regulated) cascode topology has been tested to have a low optimum equivalent noise charge (ENC) of about 900 e-+75 e-/pF FWHM at a shaping time of 0.5 μs and the gain (voltage output to charge input) is 0.9/pF. The gain of the shaper is about 2.5/pF and the shaping time can be varied slightly from an external pin. This chip is capable of sensing bipolar signals and is linear at least up to 320 fC for negative charge and 150 fC for positive charge. The average ENC of each channel has been calculated to be about 1600 e-+80 e-/pF FWHM. Finally, the power consumption of the chip was approximately 0.13 W.
  • Keywords
    CMOS integrated circuits; avalanche photodiodes; mixed analogue-digital integrated circuits; nuclear electronics; particle detectors; preamplifiers; readout electronics; 0.5 mus; 12-channel CMOS preamplifier-shaper-discriminator ASIC; 2 mm; ROHM CMOS; avalanche photodiode; bipolar signals; charge sensitive preamplifier; digital encoder; equivalent noise charge; gain-boosted regulated cascode topology; gas counter readout; window type discriminator; Application specific integrated circuits; Avalanche photodiodes; CMOS technology; Counting circuits; Energy consumption; Noise shaping; Preamplifiers; Testing; Topology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2005 IEEE
  • ISSN
    1095-7863
  • Print_ISBN
    0-7803-9221-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2005.1596277
  • Filename
    1596277