DocumentCode :
451482
Title :
Evaluation of 5 mm-thick CdTe detectors from the company Acrorad
Author :
Garson, Alfred, III ; Jung, Ira V. ; Perkins, Jeremy ; Krawczynski, Henric
Author_Institution :
Washington Univ., St. Louis, MO, USA
Volume :
1
fYear :
2005
fDate :
23-29 Oct. 2005
Firstpage :
458
Lastpage :
461
Abstract :
Using 2×2×0.5 cm3 cadmium telluride (CdTe) substrates from the company Acrorad, we have fabricated detectors with planar cathode contacts and 8×8 anode pixels. We investigate the I-V characteristics and energy resolution of the detectors for different contact materials and surface treatments. After biasing the detectors for a certain time, the dark currents increase dramatically. Our studies show that the time before breakdown decreases for higher detector temperatures and for higher applied bias voltages. We obtained the best results with a Pt cathode contact and In anode pixels when we heat the detector to 90°C for 30 minutes prior to depositing the In contacts. Flood-illuminating the detector with 662 keV X-rays, we measured the pulse length distribution and derived an electron mobility of ∼860 cm2 V-1s-1. We show that the energy resolution can be improved by correcting the anode signals for the depth of the primary interaction. Operated at a temperature of -40°C and a cathode bias voltage of -500 V, the best pixels of the best detector achieved full width half maximum (FWHM) energy resolutions of 8 keV (6.4%) and 23 keV (3.4%) at 122 keV and 662 keV, respectively.
Keywords :
X-ray apparatus; X-ray detection; semiconductor counters; -40 degC; -500 V; 122 keV; 2 cm; 30 min; 5 mm; 662 keV; 90 degC; Acrorad CdTe detectors; I-V characteristics; In anode pixels; Pt cathode contact; X-rays; cadmium telluride substrates; cathode bias voltage; dark currents; electron mobility; energy resolution; flood illumination; planar cathode contacts; pulse length distribution; Anodes; Breakdown voltage; Cadmium compounds; Cathodes; Dark current; Detectors; Energy resolution; Pulse measurements; Surface treatment; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
ISSN :
1095-7863
Print_ISBN :
0-7803-9221-3
Type :
conf
DOI :
10.1109/NSSMIC.2005.1596292
Filename :
1596292
Link To Document :
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