Title :
A test bench for full characterization of the DIALOG chip
Author :
Cadeddu, Sandro ; De Leo, Vincenzo ; Deplano, Caterina ; Fellow, A.L.
Author_Institution :
Ist. Nazionale di Fisica Nucl., Cagliari
Abstract :
We present a semi-automatic test system designed for the complete characterization of the DIALOG integrated circuit. The DTS (DIALOG test system) checks all the circuit functionalities. It measures the DIALOG output channels programmable time delay and width with 72 ps time resolution. DIALOG threshold voltage outputs are measured with a resolution of 0.6 mV. The complete characterization of one chip takes about 2 minutes
Keywords :
integrated circuit testing; integrated circuits; multiwire proportional chambers; muon detection; 0.6 mV; 72 ps; DIALOG chip full characterization; DIALOG integrated circuit; DIALOG output channels programmable time delay; DIALOG test system; DIALOG threshold voltage outputs; circuit functionalities; multiwire proportional chambers; muon chambers; semiautomatic test system; Circuit testing; Delay effects; Detectors; Frequency; Integrated circuit measurements; Integrated circuit testing; Mesons; Semiconductor device measurement; System testing; Variable speed drives;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
Print_ISBN :
0-7803-9221-3
DOI :
10.1109/NSSMIC.2005.1596347
