Pico-precision displacement sensor using digital image analysis

A new digital image analysis method combined with statistical error analysis for precision position monitoring is described. Prime motivation was to monitor mechanical deformations of large tracking chambers. The author developed optical alignment system using light source beams and CCD cameras, combined with semi-offline digital image analysis software for muon tracking chambers for PHENIX experiment at RHIC. Obtained resolution of one micron precision is enough sufficient, however, the author developed a new analysis method in order to improve the resolutions without constructing new expensive devices. Applying the new method, it is shown that the position determination resolution can be improved from one micron to 10 nm. This analysis method is applied to a new displacement sensor, which is a dedicated purpose new device. A prototype device has been constructed, showing extremely high resolution of around 100 pm. The present device is now utilized in a table-top gravity experiment, motivated by the possible violation of Newtonian gravitational law. A prototype system using digital video camera and its applications are described