Title :
A GEANT-based model for single event upsets in SRAM FPGAs for use in on-detector electronics
Author :
Skutnik, Steven E. ; Lajoie, John G.
Author_Institution :
Dept. of Phys. & Astron., Iowa State Univ., Ames, IA
Abstract :
A model is proposed to calculate expected single event upset rates in Xilinx\´s line of radiation-hardened field programmable gate array offerings for the radiation environment at the PHENIX experiment on the Relativistic Heavy Ion Collider at Brookhaven National Laboratory. The results of this model are compared to an experiment carried out at PHENIX, where actual upset data was obtained. Specific attention is given to unique features of the model, including major sources of "secondary" radiation flux
Keywords :
field programmable gate arrays; nuclear electronics; radiation hardening (electronics); GEANT-based model; PHENIX experiment; Relativistic Heavy Ion Collider; SRAM FPGA; Xilinx radiation-hardened field programmable gate array; on-detector electronics; secondary radiation flux; single event upset rates; Astronomy; Field programmable gate arrays; Logic devices; Neutrons; Physics; Protons; Random access memory; Single event transient; Single event upset; Testing;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
Print_ISBN :
0-7803-9221-3
DOI :
10.1109/NSSMIC.2005.1596447
