Title :
An Algorithm for Diagnosing Two-Line Bridging Faults in Combinational Circuits
Author :
Chakravarty, Sreejit ; Gong, Yiming
Author_Institution :
Department of Computer Science, State University of New York, Buffalo, NY
Abstract :
A novel algorithm for diagnosing all Two-Line Bridging Faults in Combinational Circuits is presented. It assumes the Wired-OR (Wired-AND) model and uses: SOPS to represent the set of possible bridging faults making it space efficient; and a set of rules for dropping faults from the set of possible faults. The rules use fault dictionaries, not for bridging faults but, for stuck-at faults only. Experimental results point to the computational feasibility of considering all two-line bridging faults while diagnosing combinational circuits.
Keywords :
Circuit faults; Circuit testing; Combinational circuits; Computer science; Dictionaries; Electric resistance; Feedback; Optimized production technology; Semiconductor device modeling;
Conference_Titel :
Design Automation, 1993. 30th Conference on
Print_ISBN :
0-89791-577-1
DOI :
10.1109/DAC.1993.204003