Title :
Practical Statistical Design of Complex Integrated Circuit Products
Author :
Duvall, Steven G.
Author_Institution :
Intel Corporation, Santa Clara, CA
Abstract :
A practical methodology for the statistical design of complex, logic integrated circuit products is described. It virtually eliminates the overhead associated with statistical modeling by combining a fully automatic, computationally-efficient statistical circuit simulator and worst case simulation tools into a hierarchical design flow.
Keywords :
Analytical models; Capacitance; Circuit simulation; Computational modeling; Design methodology; Integrated circuit interconnections; Logic circuits; Logic design; Process design; Uncertainty;
Conference_Titel :
Design Automation, 1993. 30th Conference on
Print_ISBN :
0-89791-577-1
DOI :
10.1109/DAC.1993.204010
