DocumentCode
451973
Title
Incremental Event-Driven Simulation of Digital FET Circuits
Author
Visweswariah, Chandramouli ; Wehbeh, Jalal A.
Author_Institution
IBM T. J. Watson Research Center, Yorktown Heights, NY
fYear
1993
fDate
14-18 June 1993
Firstpage
737
Lastpage
741
Abstract
This paper presents a new and efficient approach to transistor-level simulation of very large, digital, FET circuits. By the simple expedient of letting only one device current change at any given time, simulation can be performed in an event-driven manner. Circuit equations are incrementally re-solved after each local perturbation. A prototype implementation of the new formulation and experimental results are presented.
Keywords
Circuit simulation; Computational modeling; Discrete event simulation; Equations; FET circuits; Piecewise linear approximation; Piecewise linear techniques; Switches; Virtual prototyping; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1993. 30th Conference on
ISSN
0738-100X
Print_ISBN
0-89791-577-1
Type
conf
DOI
10.1109/DAC.1993.204044
Filename
1600317
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