Title :
Wavelength Sensitivity of Polarization Dependent Loss Measurements in Swept Laser Systems
Author :
Anderson, Duwayne
Author_Institution :
Tektronix, 14150 SW Karl Braun Drive, Beaverton, Oregon 97077, duwayne.r.Anderson@tek.com
Abstract :
Sensitivity of polarization-dependent loss (PDL) measurements to wavelength errors in swept-laser systems is presented. Results show wavelength error less than 2 pm is needed for accurate PDL measurements on devices with large transmission slopes.
Conference_Titel :
Optical Communication, 2002. ECOC 2002. 28th European Conference on
Conference_Location :
Copenhagen
Print_ISBN :
87-90974-63-8
