Author :
Choi, Bo-Hun ; Chu, Moo-Jung ; Park, Hyo-Hoon
Author_Institution :
School of Eng., ICU, P.O.Box 77, Yusong, Taejon, 305-600, Korea. Now with PRL, Dept. of Electrical & Electronic Engineering, The U. Melbourne, Vic. 3010, Australia.; b.choi@ee.mu.oz.au