Title :
Shortening Burn-In Test: Application of Weibull Statistical Analysis & HVST
Author :
Ooi, Melanie Po-Leen ; Zainal Abu Kassim ; Demidenko, Serge
Author_Institution :
Monash Univ. Malaysia, Selangor
Abstract :
Burn-in is currently the most popular form of accelerated testing in the semiconductor industry. It subjects devices under test to accelerated temperature and voltage stresses to screen so-called ´infant mortalities´ (latent failures). However, burn-in incurs high cost and turnaround time. This paper presents a methodology for burn-in test reduction based on the extended use of the high-voltage stress test (HVST) technique. The Weibull statistical analysis is used to model the infant mortality failure distribution. The linear rectification method is employed to estimate the Weibull parameters. The results show that the burn-in duration can be reduced by up to 90% using the proposed approach
Keywords :
Weibull distribution; failure analysis; integrated circuit reliability; integrated circuit testing; life testing; statistical analysis; Weibull statistical analysis; accelerated temperature; accelerated testing; burn-in test; high-voltage stress test; infant mortality failure distribution; integrated circuit testing; latent failures; linear rectification method; semiconductor industry; Assembly; Circuit testing; Costs; Integrated circuit testing; Life estimation; Manufacturing processes; Statistical analysis; Stress; Temperature; Voltage; burn-in reduction; integrated circuit testing; voltage stress;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604066
