Title :
Testing Analog and Mixed-Signal Circuits with Built-In Hardware - A New Approach
Author :
Zakizadeh, Jila ; Das, Sunil R. ; Assaf, Mansour H. ; Petriu, Emil M. ; Sahinoglu, Mehmet ; Jone, Wen-Ben
Author_Institution :
Sch. of Inf. Technol. & Eng., Ottawa Univ., Ont.
Abstract :
The subject paper aims to develop approach to testing analog and mixed-signal embedded cores-based system-on-chip (SOC) with built-in hardware. In particular, oscillation-based built-in self-test (OBIST) methodologies for testing analog parts in mixed-signal circuits are explored here. A major advantage of OBIST methods is that they do not require either stimulus generators or complex response analyzers, which makes them suitable for testing analog circuits in mixed-signal system-on-chip (SOC) environments. In this paper, analog circuit test techniques based on the principle of OBIST were implemented. Simulation results on some sample analog benchmark circuits are provided to demonstrate the feasibility of the proposed implementations
Keywords :
analogue integrated circuits; automatic test equipment; automatic testing; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; OBIST method; analog circuit testing; automatic test equipment; built-in hardware; embedded core-based system-on-chip; mixed-signal circuit testing; mixed-signal system-on-chip; oscillation-based built-in self-test; Analog circuits; Automatic testing; Built-in self-test; Circuit testing; Costs; Digital circuits; Hardware; Semiconductor device testing; System testing; System-on-a-chip; Automatic test equipment (ATE); built-in self-test (BIST); circuit under test (CUT); design-for-testability (DFT); mixed-signal test; oscillation-based built-in self-test (OBIST); system-on-chip (SOC);
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604093
