Title :
System for the testing of high-resolution ADCs at frequency of 1 MHz
Author :
Haasz, Vladimír ; Slepicka, David ; Komárek, Milan ; Roztocil, J.
Author_Institution :
Dept. of Meas., Czech Tech. Univ., Prague
Abstract :
A system for the testing of ADCs at the frequency range of 1 MHz was designed and prototyped at the Dept. of Measurement, CTU FEE. Two methods were applied to suppress the influence of signal distortion: 1) filtering by special high-quality filters with a near-linear transfer characteristic; 2) filtering by low-cost filters and the application of following numerical correction of residual distortion. Low-cost as well as high-quality filters were manufactured. Experimental results showed that the method is directly applicable for the testing of ADCs with the ENOB up to 14 in case of low-cost filters and up to 20 in case of high-quality filters. An extension of the method for the testing of ADCs with hither ENOB can bring an application of the frequency spectrum correction method
Keywords :
analogue-digital conversion; distortion; filters; test equipment; 1 MHz; ADC testing; frequency spectrum correction; high-quality filters; high-resolution ADC; low-cost filters; near-linear transfer characteristic; signal distortion; signal filtering; test signal; Band pass filters; Coils; Distortion measurement; Electric variables measurement; Filtering; Frequency measurement; Power harmonic filters; Resonator filters; Signal generators; System testing; ADC testing; frequency spectrum correction; signal filtering; test signal;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604117
