• DocumentCode
    452792
  • Title

    Fault-Tolerance in Micro Programmed Control: Architectures & Schematic Synthesis

  • Author

    Demidenko, Serge ; Levine, Eugene ; Piuri, Vincenzo ; Gupta, Gourab Sen

  • Author_Institution
    Sch. of Eng., Monash Univ., Selangor
  • Volume
    1
  • fYear
    2005
  • fDate
    16-19 May 2005
  • Firstpage
    305
  • Lastpage
    310
  • Abstract
    The paper deals with architectural and schematic design of concurrently (on-line) self-checking Micro Program Control Units. The checking is organised by using a special check keys added to each microinstruction. The sequence of keys appearing on the output of MPCU during the program execution is then monitored. It allows checking the control flow by comparing the actual sequence of the check keys against a reference sequence corresponding to fault-free operation of MPCU. Three main architectures discussed in the paper are: a) based on the use of Compression-in-Space of the check keys; b) based on implementation of Compression-in-Space & Compression-in-Time; and c) Compression & Generation check keys-based. The design procedure for the checking circuitry based on the use of Compression & Generation is discussed in the paper for two types of the check key generators: a standard one (for example, M-sequence generator) and a unique generator (specially synthesised sequential automata producing some required digital sequence)
  • Keywords
    fault tolerant computing; microprogramming; check keys; compression & generation; compression-in-space; compression-in-time; fault-tolerance; microprogrammed control; program flow monitoring; Automatic generation control; Circuit faults; Control systems; Design engineering; Fault tolerance; Flow graphs; Information technology; Monitoring; Paper technology; Registers; architectural and schematic implementations; check key generation and compression; microprogram control unit; program flow monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
  • Conference_Location
    Ottawa, Ont.
  • Print_ISBN
    0-7803-8879-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2005.1604123
  • Filename
    1604123