• DocumentCode
    452839
  • Title

    Automatic Evaluation of Fabric Pilling Using a 3-D Non-contact Scanning System

  • Author

    Kim, Soo Chang ; Kang, Tae Jin

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Seoul Nat. Univ.
  • Volume
    1
  • fYear
    2005
  • fDate
    16-19 May 2005
  • Firstpage
    628
  • Lastpage
    632
  • Abstract
    To comprehensively understand the fabric pilling phenomena and exactly grade the degree of pilling, the overall fabric surface ruggedness as well as pill characteristics such as pill number, area, and population density should be evaluated with a 3D noncontact scanning system, which obtains 3D surface data with high accuracy. The fractal dimension calculated by a wavelet-fractal method and the standard deviation of mean curvature are used as descriptors of fabric surface ruggedness. Wavelet reconstruction makes it easier the localization and characterization of pills. Karhunen-Loeve (KL) transform is employed to reduce dimension and speed the pilling grading procedures. Bayes classifier, minimum distance classifier, k-nearest neighbors classifier, and neural network are applied to the fabric pilling grading. The experimental results show that the automatic fabric pilling measurement system proposed in this study is effective and feasible
  • Keywords
    Bayes methods; Karhunen-Loeve transforms; computerised instrumentation; fabrics; neural nets; wavelet transforms; 3D noncontact scanning system; 3D surface data; Bayes classifier; Karhunen-Loeve transform; automatic fabric pilling measurement system; fabric pilling grading; fabric surface ruggedness; fractal dimension; k-nearest neighbors classifier; minimum distance classifier; neural network; pill area; pill characteristics; pill number; pilling grading procedures; population density; wavelet reconstruction; wavelet-fractal method; Fabrics; Fractals; Image color analysis; Image reconstruction; Karhunen-Loeve transforms; Pattern classification; Surface reconstruction; Surface resistance; Surface treatment; Surface waves; 3-D surface scanning; Fabric pilling; K-L transform; fractal dimension; pattern classification; wavelet reconstruction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
  • Conference_Location
    Ottawa, Ont.
  • Print_ISBN
    0-7803-8879-8
  • Type

    conf

  • DOI
    10.1109/IMTC.2005.1604193
  • Filename
    1604193