DocumentCode :
452839
Title :
Automatic Evaluation of Fabric Pilling Using a 3-D Non-contact Scanning System
Author :
Kim, Soo Chang ; Kang, Tae Jin
Author_Institution :
Sch. of Mater. Sci. & Eng., Seoul Nat. Univ.
Volume :
1
fYear :
2005
fDate :
16-19 May 2005
Firstpage :
628
Lastpage :
632
Abstract :
To comprehensively understand the fabric pilling phenomena and exactly grade the degree of pilling, the overall fabric surface ruggedness as well as pill characteristics such as pill number, area, and population density should be evaluated with a 3D noncontact scanning system, which obtains 3D surface data with high accuracy. The fractal dimension calculated by a wavelet-fractal method and the standard deviation of mean curvature are used as descriptors of fabric surface ruggedness. Wavelet reconstruction makes it easier the localization and characterization of pills. Karhunen-Loeve (KL) transform is employed to reduce dimension and speed the pilling grading procedures. Bayes classifier, minimum distance classifier, k-nearest neighbors classifier, and neural network are applied to the fabric pilling grading. The experimental results show that the automatic fabric pilling measurement system proposed in this study is effective and feasible
Keywords :
Bayes methods; Karhunen-Loeve transforms; computerised instrumentation; fabrics; neural nets; wavelet transforms; 3D noncontact scanning system; 3D surface data; Bayes classifier; Karhunen-Loeve transform; automatic fabric pilling measurement system; fabric pilling grading; fabric surface ruggedness; fractal dimension; k-nearest neighbors classifier; minimum distance classifier; neural network; pill area; pill characteristics; pill number; pilling grading procedures; population density; wavelet reconstruction; wavelet-fractal method; Fabrics; Fractals; Image color analysis; Image reconstruction; Karhunen-Loeve transforms; Pattern classification; Surface reconstruction; Surface resistance; Surface treatment; Surface waves; 3-D surface scanning; Fabric pilling; K-L transform; fractal dimension; pattern classification; wavelet reconstruction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
Type :
conf
DOI :
10.1109/IMTC.2005.1604193
Filename :
1604193
Link To Document :
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