Title :
Analysis of Linearity and Frequency Response of a New Piezoelectric Flextensional Actuator Using a Homodyne Interferometer and the J1-J4Method
Author :
Marçal, Luiz Antõnio Perezi ; Leao, J.V.F. ; Nader, Gilder ; Silva, Emílio Carlos Nelli ; Higuti, Ricardo Tokio ; Kitano, Cláudio
Author_Institution :
Dept. of Electr. Eng., Sao Paulo State Univ.
Abstract :
Piezoelectric transducers are widely used in high resolution positioning systems, compact ultrasonic motors and vibration suppressors. In this work it is described the experimental characterization of a new flextensional piezoactuator designed by the topology optimization method. Using a homodyne Michelson interferometer and applying the J1-J4 method for signal demodulation, which provides a linear and direct measurement of dynamic optical phase shift independently of fading, the nanometric displacements of points on the piezoactuator surface were determined. Linearity and frequency response of the flextensional piezoactuator were evaluated up to 50 kHz, beyond the first resonance frequency of its PZT-5A piezoceramic. To confirm the observed frequencies of resonance it was also utilized an impedance analyzer to measure the magnitude and phase of the piezoactuator admittance
Keywords :
Michelson interferometers; displacement measurement; piezoelectric actuators; piezoelectric transducers; 50 kHz; high resolution positioning systems; homodyne Michelson interferometer; impedance analyzer; nanometric displacement measurement; optical interferometer; optical phase shift; piezoactuator admittance measurement; piezoelectric flextensional actuator; piezoelectric transducers; signal demodulation; topology optimization; ultrasonic motors; vibration suppressors; Frequency response; Hydraulic actuators; Linearity; Optical interferometry; Phase measurement; Piezoelectric actuators; Piezoelectric transducers; Resonance; Resonant frequency; Topology; Piezoelectric flextensional actuator; nanometric displacement measurement; optical interferometer;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
DOI :
10.1109/IMTC.2005.1604301