DocumentCode :
452933
Title :
Dielectric Charge Measurement in Capacitive Microwave Shunt Switches
Author :
Schultz, John S. ; Firebaugh, Samara L. ; Charles, Harry K., Jr. ; Edwards, Richard L. ; Keeney, Allen C. ; Wilderson, Samuel F.
Author_Institution :
Dept. of Electr. Eng., United States Naval Acad., Annapolis, MD
Volume :
2
fYear :
2005
fDate :
16-19 May 2005
Firstpage :
1345
Lastpage :
1349
Abstract :
The use of microelectromechanical systems as electronic switches in circuits for microwave frequency applications has grown considerably in the past decade. One phenomenon that limits the reliability of these switches is dielectric charging. Using a non-contact technique for measuring dielectric charging, the rate at which dielectric charging occurs can be measured and used to predict further charging. The prediction of dielectric charging can help optimize the controllable variables to minimize the extent of the phenomenon
Keywords :
charge measurement; dielectric properties; microswitches; microwave switches; capacitive microwave shunt switches; dielectric charge measurement; dielectric charging; electronic switches; microelectromechanical systems; microswitches; microwave frequency; noncontact technique; Bridge circuits; Charge measurement; Communication switching; Conductors; Dielectric measurements; Electrostatics; Micromechanical devices; Power semiconductor switches; Radiofrequency microelectromechanical systems; Voltage; MEMS; Microelectromechanical devices; dielectric charging; micromachining; microwave; reliability; switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
Type :
conf
DOI :
10.1109/IMTC.2005.1604367
Filename :
1604367
Link To Document :
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