Time-domain vector fitting extracted characteristic model for VLSI interconnects analysis

In this paper, a systematic method for deriving the characteristic model of interconnects from time-domain vector fitting is presented. The method is based on the iteration and convolution of time series by recursion. The approach extracts model parameters from terminal voltage waveforms directly by time-domain vector fitting so that transformation to frequency domain can be avoided and interconnect terminated with active nonlinear loading can be simulated efficiently in SPICE-compatible simulator. Example is given to illustrate the accuracy of the extracted model.