DocumentCode
453111
Title
Capacitance extraction of on-chip circular stacked inductors
Author
Liu, Xiaocha ; Lin, Liang ; Yin, Wen-Yan ; Mao, Junfa
Author_Institution
Sch. of Electron. Inf. & Electr. Eng., Shanghai Jiao Tong Univ., China
Volume
2
fYear
2005
fDate
4-7 Dec. 2005
Abstract
In this paper, we proposed a method to characterize the capacitive coupling effects in circular stacked inductors, which takes the non-overlapping between upper and bottom traces of different layers into account. Compared with the full-wave method and the analytical method with completely overlapping assumption, our method can predict self-resonant frequency (fSR) for on-chip circular stacked inductors used in RFICs more accurately.
Keywords
capacitance measurement; inductors; radiofrequency integrated circuits; capacitance extraction; capacitive coupling effects; on-chip circular stacked inductors; radiofrequency integrated circuit; self-resonant frequency; Capacitance; Clocks; Data mining; Frequency; Inductance; Inductors; Partial response channels; Q factor; Radiofrequency integrated circuits; Strontium;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN
0-7803-9433-X
Type
conf
DOI
10.1109/APMC.2005.1606439
Filename
1606439
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