DocumentCode :
453332
Title :
Investigation on the Gaussian beam scattering from non-Gaussian random rough surface
Author :
Li-Xin, Guo ; Yu-chao, Ren
Author_Institution :
Sch. of Sci., Xidian Univ., Xi´´an, China
Volume :
4
fYear :
2005
fDate :
4-7 Dec. 2005
Abstract :
In this paper, gamma function with different order K is introduced to characterize the PDF of rough surface. Using the unified full wave approach, the backscattering cross-sections of different polarizations are compared for the surfaces with gamma and Gaussian distribution. Base on the previous investigation on the surface scattering with the plane wave incidence, this study extends to Gaussian beam fields excited by 2-D aperture field distributions, which is assumed incident upon a 2-D dielectric rough surface. It is shown that provided the linear dimension of the rough surface is large compared with the surface height correlation length, the results obtained are close to those of the plane wave incidence.
Keywords :
Gaussian distribution; backscatter; electromagnetic wave polarisation; gamma distribution; random processes; rough surfaces; surface electromagnetic waves; 2D aperture field distributions; 2D dielectric rough surface; Gaussian beam fields; Gaussian beam scattering; Gaussian distribution; backscattering cross-sections; full wave approach; gamma distribution; gamma function; non-Gaussian random rough surface; plane wave incidence; surface height correlation length; Antenna measurements; Aperture antennas; Backscatter; Dielectrics; Gaussian distribution; Polarization; Rayleigh scattering; Rough surfaces; Surface roughness; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
Type :
conf
DOI :
10.1109/APMC.2005.1606791
Filename :
1606791
Link To Document :
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