Title :
An accurate measurement method of high permittivity materials by numerical analysis of coplanar waveguide
Author :
Tsuji, Masatoshi ; Nishikawa, Toshio ; Wakino, Kikuo ; Kitazawa, Toshihide
Author_Institution :
Dept. of Electr. & Electron. Eng., Ritsumeikan Univ., Kusatsu, Japan
Abstract :
An accurate and simple technique for evaluation of high permittivity materials, (Bs,Sr) TiO3 (BST) ceramics, in the microwave region is developed with assistance of full-wave analysis of a coplanar waveguide (CPW). S-parameters of the CPW are measured from 0.5 to 40 GHz, and effective permittivity and attenuation constants at each frequency are obtained from the S-parameter data. Relative permittivity (εr) and tanδ are evaluated by numerical calculations using the extended spectral domain approach taking the conductor thickness effect into consideration. The estimated εr´s of Ba0.7Sr0.3TiO3, Ba0.5Sr0.5TiO3, and Ba0.3Sr0.7TiO3 are 660, 1650, and 4450, respectively. The εr decreases slightly as frequency increased due to dielectric dispersion. This technique enables the evaluation of even a small deviation in high permittivity materials.
Keywords :
S-parameters; barium compounds; ceramics; coplanar waveguides; dielectric materials; microwave materials; microwave measurement; permittivity; strontium compounds; titanium compounds; 0.5 to 40 GHz; BST ceramics; Ba0.3Sr0.7TiO3; Ba0.5Sr0.5TiO3; Ba0.7Sr0.3TiO3; S-parameters; attenuation constant; conductor thickness effect; coplanar waveguides; dielectric dispersion; full-wave analysis; high permittivity materials; microwave region; spectral domain approach; Attenuation measurement; Binary search trees; Ceramics; Coplanar waveguides; Frequency; Microwave theory and techniques; Numerical analysis; Permittivity measurement; Scattering parameters; Strontium; BST; coplanar waveguide; higher-order mode; permittivity; spectral domain approach;
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
DOI :
10.1109/APMC.2005.1606806