DocumentCode :
453343
Title :
Nondestructive and simultaneous measurement of complex EM parameters with scalar reflectometer
Author :
Chen, Chun-Ping ; Ma, Zhewang ; Anada, Tetsuo ; Hsu, Jui-Pang ; Xu, Deming
Author_Institution :
High-Tech Res. Center, Kanagawa Univ., Yokohama, Japan
Volume :
4
fYear :
2005
fDate :
4-7 Dec. 2005
Abstract :
A scalar reflectometer based, low cost method, named "multi-thickness method" (MTM), is proposed for non destructively and simultaneously characterizing the complex permittivity and permeability of high loss materials via an open-ended coaxial probe. The measurement system is established, while the sample-loaded open-ended coaxial probe is modeled by the spectral domain immitance (SDI) method. A discussion about how to select the multi thicknesses of test sample is also included based on the analysis and our experiences. The broadband frequency-swept measurement has been conducted on a typical absorbing material under different thicknesses combination conditions. The experiment results agree well with the reference data, which validates the feasibility and effectiveness of this improved technique.
Keywords :
electromagnetic wave propagation; measurement systems; probes; reflectometers; absorbing material; broadband frequency-swept measurement; complex EM parameters; complex permittivity; measurement system; multi-thickness method; open-ended coaxial probe; permeability; scalar reflectometer; spectral domain immitance method; Admittance; Coaxial components; Conducting materials; Costs; Electromagnetic compatibility; Frequency; Loss measurement; Probes; Reflection; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN :
0-7803-9433-X
Type :
conf
DOI :
10.1109/APMC.2005.1606808
Filename :
1606808
Link To Document :
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