Title : 
Nondestructive and simultaneous measurement of complex EM parameters with scalar reflectometer
         
        
            Author : 
Chen, Chun-Ping ; Ma, Zhewang ; Anada, Tetsuo ; Hsu, Jui-Pang ; Xu, Deming
         
        
            Author_Institution : 
High-Tech Res. Center, Kanagawa Univ., Yokohama, Japan
         
        
        
        
        
            Abstract : 
A scalar reflectometer based, low cost method, named "multi-thickness method" (MTM), is proposed for non destructively and simultaneously characterizing the complex permittivity and permeability of high loss materials via an open-ended coaxial probe. The measurement system is established, while the sample-loaded open-ended coaxial probe is modeled by the spectral domain immitance (SDI) method. A discussion about how to select the multi thicknesses of test sample is also included based on the analysis and our experiences. The broadband frequency-swept measurement has been conducted on a typical absorbing material under different thicknesses combination conditions. The experiment results agree well with the reference data, which validates the feasibility and effectiveness of this improved technique.
         
        
            Keywords : 
electromagnetic wave propagation; measurement systems; probes; reflectometers; absorbing material; broadband frequency-swept measurement; complex EM parameters; complex permittivity; measurement system; multi-thickness method; open-ended coaxial probe; permeability; scalar reflectometer; spectral domain immitance method; Admittance; Coaxial components; Conducting materials; Costs; Electromagnetic compatibility; Frequency; Loss measurement; Probes; Reflection; Testing;
         
        
        
        
            Conference_Titel : 
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
         
        
            Print_ISBN : 
0-7803-9433-X
         
        
        
            DOI : 
10.1109/APMC.2005.1606808