DocumentCode
453344
Title
The RSFQ test-timing model for delay insensitive data processing pipeline design
Author
Zhang, Zhong-hai ; Guan, Bo-Ran
Author_Institution
Sch. of Electron. Eng., Xidian Univ., Xi´´an, China
Volume
4
fYear
2005
fDate
4-7 Dec. 2005
Abstract
A novel asynchronous RSFQ digital circuit model, test-timed RSFQ digital model (TT) is proposed in this paper. With this asynchronous approach, data is transferred in a delay-insensitive fashion to avoid the problems aroused from the global clock distribution and the timing uncertainty. In the TT model, the timing pulse to the logic module will be generated with a test logic module, instead of the time delay module, which should be necessary in most asynchronous circuits. The elimination of the delay module can basically solve the timing uncertainty bothered in the RSFQ digital system layouts. The transient simulations and logic simulations have been made for the OR module and a RSFQ data processing pipeline based on the TT scheme has been designed. The logic simulations have also been made for this pipeline, and the results showed its feasibility and satisfaction for the RSFQ digital system applications.
Keywords
asynchronous circuits; integrated circuit modelling; logic design; logic testing; pipeline processing; RSFQ digital system layouts; RSFQ test-timing model; asynchronous RSFQ digital circuit model; delay insensitive data processing pipeline design; global clock distribution; logic module; logic simulations; test-timed RSFQ digital model; time delay module; timing pulse; timing uncertainty; transient simulations; Circuit simulation; Circuit testing; Data processing; Delay; Logic circuits; Logic testing; Pipelines; Process design; Timing; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference Proceedings, 2005. APMC 2005. Asia-Pacific Conference Proceedings
Print_ISBN
0-7803-9433-X
Type
conf
DOI
10.1109/APMC.2005.1606813
Filename
1606813
Link To Document