Title :
Backscattering from a spatial random permittivity plate: a statistical approach
Author :
Dauron, G. ; Wong, M.F. ; Richalot, E. ; Picon, O. ; Wiart, J.
Author_Institution :
France Telecom R&D, Issy les Moulineaux, France
Abstract :
This paper presents a way of finding a correlation between a scattering plate with spatial random permittivity and its far field diffraction diagram when illuminated by a plane wave. The random permittivity plate profile is generated using a pseudo 2D-Markov process. Far fields are processed with the fast multipole method. Similarities have been found between the distribution of permittivity on the plate and the associated far fields.
Keywords :
Markov processes; backscatter; electromagnetic wave scattering; permittivity; statistical analysis; backscattering; far field diffraction diagram; fast multipole method; plane wave illumination; pseudo 2D-Markov process; spatial random permittivity plate; statistical approach; Autocorrelation; Backscatter; Base stations; Building materials; Concrete; Electromagnetic fields; Electromagnetic scattering; Glass; Magnetic materials; Permittivity;
Conference_Titel :
Microwave Conference, 2005 European
Print_ISBN :
2-9600551-2-8
DOI :
10.1109/EUMC.2005.1610179
