Title :
Taming the DFM beast into an adorable pet - a comprehensive approach
Author :
Pitchumani, Vijay
Author_Institution :
Intel Corp., Santa Clara, CA
Abstract :
Summary form only given. Design for manufacturability, or DFM, strikes mortal fear in the heart of design and manufacturing communities. Relentless technology scaling coupled with an uncooperative lithography has begotten a significant DFM problem. Today, the scope of the problem has expanded to include not only functional yield and parametric yield, but manufacturing cost containment as well. Taming this DFM beast requires an orchestrated assault on multiple fronts
Keywords :
design for manufacture; integrated circuit design; integrated circuit yield; lithography; DFM; design for manufacturability; functional yield; manufacturing cost containment; parametric yield; technology scaling; uncooperative lithography; Design for manufacture; Educational institutions; Guidelines; Heart; Lithography; Power system modeling; Signal design; Signal processing; Timing; Virtual manufacturing;
Conference_Titel :
ASIC, 2005. ASICON 2005. 6th International Conference On
Conference_Location :
Shanghai
Print_ISBN :
0-7803-9210-8
DOI :
10.1109/ICASIC.2005.1611243
