DocumentCode :
454418
Title :
On-chip 8GHz Non-Periodic High-Swing Noise Detector
Author :
Abbas, Mohamed ; Ikeda, Makoto ; Asada, Kunihiro
Author_Institution :
Dept. of Electron. Eng., Tokyo Univ.
Volume :
1
fYear :
2006
fDate :
6-10 March 2006
Firstpage :
1
Lastpage :
2
Abstract :
In this paper we present an overview of an on-chip noise detection circuit. Mainly, this work is different form the previous works concerning on-chip noise measurement in one or more of the following: First: it does not assume specific noise properties such as periodicity. Second: the requested bandwidth of the output channel can be adjusted freely, therefore, the user can avoid the effect of on-chip parasites and the need to off-chip sophisticated monitoring tools. Third: the detector is equipped with an on-chip voltage divider, which enables measuring the high and low swing fluctuations accurately. Therefore, the detector is suitable to measure the non-periodic /single event noise for the purpose of reliability evaluation and performance modeling. A slower version of the detector is implemented in a test chip using Hitachi 0.18mum technology
Keywords :
integrated circuit design; integrated circuit measurement; integrated circuit noise; large scale integration; noise measurement; sensors; 0.18 micron; 8 GHz; noise measurement; noise properties; on-chip noise detection circuit; performance modeling; periodicity; reliability evaluation; single event noise; swing fluctuations; voltage divider; Bandwidth; Circuit noise; Detectors; Event detection; Fluctuations; Monitoring; Noise measurement; Semiconductor device measurement; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
Type :
conf
DOI :
10.1109/DATE.2006.244040
Filename :
1656971
Link To Document :
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