• DocumentCode
    454435
  • Title

    Integrated Placement and Skew Optimization for Rotary Clocking

  • Author

    Venkataraman, G. ; Jiang Hu ; Liu, F. ; Sze, C.-N.

  • Author_Institution
    Dept. of Electr. Eng., Texas A&M Univ., College Station, TX
  • Volume
    1
  • fYear
    2006
  • fDate
    6-10 March 2006
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The clock distribution network is a key component on any synchronous VLSI design. As technology moves into the nanometer era, innovative clocking techniques are required to solve the power dissipation and variability issues. Rotary clocking is a novel technique which employs unterminated rings formed by differential transmission lines to save power and reduce skew variability. Despite its appealing advantages, rotary clocking requires latch locations to match pre-designed clock skew on rotary clock rings. This requirement is a difficult chicken-and-egg problem which prevents its wide application. In this work, we proposed an integrated placement and skew scheduling methodology to break this hurdle, making rotary clocking compatible with practical design flows. A network flow based latch assignment algorithm and a cost-driven skew optimization algorithm are developed. Experiments show that our method can generate chip placements which satisfy the unique requirements of rotary clocks, without sacrificing design quality. By enabling concurrent clock network and placement design, our method can also be applied in other clocking methodologies as well
  • Keywords
    VLSI; clocks; flip-flops; integrated circuit design; logic design; clock distribution network; clock skew; concurrent clock network; differential transmission lines; integrated placement; latch assignment algorithm; latch locations; rotary clock rings; rotary clocking; skew optimization; skew scheduling; synchronous VLSI design; unterminated rings; Circuits; Clocks; Design methodology; Latches; Power dissipation; Power supplies; Power transmission lines; Semiconductor device noise; Temperature distribution; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
  • Conference_Location
    Munich
  • Print_ISBN
    3-9810801-1-4
  • Type

    conf

  • DOI
    10.1109/DATE.2006.244115
  • Filename
    1656991