Title :
Enabling Fine-Grain Leakage Management by Voltage Anchor Insertion
Author :
Babighian, Pietro ; Benini, Luca ; Macii, Alberto ; Macii, Enrico
Author_Institution :
Politecnico di Torino
Abstract :
Functional unit shutdown based on MTCMOS devices is effective for leakage reduction in aggressively scaled technologies. However, the applicability of MTCMOS-based shutdown in a synthesis-based design flow poses the challenge of interfacing logic blocks in shutdown mode with active units: The outputs of inactive gates can float at intermediate voltages, causing very large short-circuit currents in the active gates they drive. In this paper, we propose two novel low-overhead elementary cells that fully address this issue. These cells can be added to any synthesis library, and they can be inserted into a netlist at the boundary between shutdown and active regions. Our results show that: (i) our cells solve the interfacing problem with minimum overhead; and (ii) a non-intrusive design flow enhancement is sufficient to automatically insert interface cells in post-synthesis netlists
Keywords :
CMOS logic circuits; leakage currents; logic design; threshold logic; MTCMOS-based shutdown; fine-grain leakage management; leakage reduction; logic blocks; low-overhead elementary cells; short-circuit currents; synthesis-based design flow; voltage anchor insertion; CMOS logic circuits; CMOS technology; Leakage current; Logic design; Logic devices; Logic gates; MOSFETs; Sleep; Switches; Voltage;
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
DOI :
10.1109/DATE.2006.243770