Title :
Coverage Loss By Using Space Compactors in Presence of Unknown Values
Author :
Chao, Mango C -T ; Wang, Seongmoon ; Chakradhar, Srimat T. ; Wei, Wenlong ; Cheng, Kwang-Ting
Author_Institution :
Dept. of ECE, UC-Santa Barbara, Santa Barbara, CA
Abstract :
The presence of unknown values in simulation is the greatest barrier to effective test response compaction. For space compactors, some responses may not be observable due to the masking effect caused by unknown values. This paper reports on experiments conducted to evaluate the impact on the test quality of various percentages of observable responses for both modeled and un-modeled faults
Keywords :
automatic test pattern generation; compaction; fault diagnosis; logic testing; value engineering; coverage loss; effective test response compaction; masking effect; modeled faults; space compactors; stuck at faults; test pattern generation; test quality; unknown values; unmodeled faults; Benchmark testing; Chaos; Circuit faults; Circuit simulation; Circuit testing; Compaction; Electrical fault detection; Fault detection; National electric code; Radio access networks;
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
DOI :
10.1109/DATE.2006.243930
