Title :
Ultra-Efficient (Embedded) SOC Architectures based on Probabilistic CMOS (PCMOS) Technology
Author :
Chakrapani, Lakshmi N. ; Akgul, Bilge E S ; Cheemalavagu, Suresh ; Korkmaz, Pinar ; Palem, Krishna V. ; Seshasayee, Balasubramanian
Author_Institution :
Center for Res. on Embedded Syst. & Technol., Georgia Inst. of Technol., Atlanta, GA
Abstract :
Major impediments to technology scaling in the nanometer regime include power (or energy) dissipation and "erroneous" behavior induced by process variations and noise susceptibility. In this paper, we demonstrate that CMOS devices whose behavior is rendered probabilistic by noise (yielding probabilistic CMOS or PCMOS) can be harnessed for ultra low energy and high performance computation. PCMOS devices are inherently probabilistic in that they are guaranteed to compute correctly with a probability frac12 < p < 1 and thus, by design, they are expected to compute incorrectly with a probability (1 - p). In this paper, we show that PCMOS technology yields significant improvements, both in the energy consumed as well as in the performance, for probabilistic applications with broad utility. These benefits are derived using an application-architecture-technology (A2T) co-design methodology introduced here, yielding an entirely novel family of probabilistic system-on-a-chip (PSOC) architectures. All of our application and architectural savings are quantified using the product of the energy and the performance denoted (energy times performance): the PCMOS based gains are as high as a substantial multiplicative factor of over 560 when compared to a competing energy-efficient CMOS based realization
Keywords :
CMOS integrated circuits; embedded systems; logic design; probability; system-on-chip; PCMOS based gains; PCMOS technology; PSOC architectures; application-architecture-technology; probabilistic CMOS technology; probabilistic system-on-a-chip architectures; ultra-efficient SOC architectures; CMOS process; CMOS technology; Computer architecture; Contracts; Embedded system; Energy efficiency; High performance computing; Impedance; Performance gain; System-on-a-chip;
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
DOI :
10.1109/DATE.2006.243978