DocumentCode :
454482
Title :
Minimizing Ohmic Loss and Supply Voltage Variation Using a Novel Distributed Power Supply Network
Author :
Budnik, M. ; Roy, K.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
Volume :
1
fYear :
2006
fDate :
6-10 March 2006
Firstpage :
1
Lastpage :
6
Abstract :
IR and di/dt events may cause ohmic losses and large supply voltage variations due to system parasitics. Today, parallelism in the power delivery path is used to reduce ohmic loss while decoupling capacitance is used to minimize the supply voltage variation. Future integrated circuits, however, exhibit large enough currents and current transients to mandate additional safeguards. A novel, distributed power delivery and decoupling network is introduced reducing the supply voltage variation magnitude by 67% and the future ohmic loss by 15.9W (compared to today´s power delivery and decoupling networks) using conventional processing and packaging techniques in a 130nm technology node
Keywords :
distribution networks; power supply circuits; transients; 130 nm; 15.9 W; current transients; decoupling capacitance; decoupling network; distributed power delivery; distributed power supply network; integrated circuits; ohmic loss; packaging techniques; power delivery path; supply voltage variation; Capacitors; Energy consumption; Inductance; Integrated circuit technology; Microprocessors; Packaging; Parasitic capacitance; Power generation; Power supplies; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
Type :
conf
DOI :
10.1109/DATE.2006.243979
Filename :
1657060
Link To Document :
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