Title :
Space of DRAM Fault Models and Corresponding Testing
Author :
AL-Ars, Zaid ; Hamdioui, Said ; Van de Goor, Ad J.
Author_Institution :
Lab. of Comput. Eng., Delft Univ. of Technol.
Abstract :
DRAMs play an important role in the semiconductor industry, due to their highly dense layout and their low price per bit. This paper presents the first framework of fault models specifically designed to describe the faulty behavior of DRAMs. The fault models in this paper are the outcome of a close collaboration with the industry, and are validated using a detailed. Spice-based analysis of the faulty behavior of real DRAMs. The resulting fault space is then used to derive a couple of new DRAM-specific tests, needed to detect some of the faults in practice
Keywords :
DRAM chips; SPICE; fault simulation; integrated circuit testing; DRAM fault models; DRAM faulty behavior; Spice-based analysis; corresponding testing; Collaboration; Computer industry; Conductors; Fault detection; Fault diagnosis; Mathematics; Random access memory; Resource description framework; Space technology; Testing;
Conference_Titel :
Design, Automation and Test in Europe, 2006. DATE '06. Proceedings
Conference_Location :
Munich
Print_ISBN :
3-9810801-1-4
DOI :
10.1109/DATE.2006.244080
