Automatic March Tests Generations for Static Linked Faults in SRAMs

Author

Benso, A. ; Bosio, A. ; Di Carlo, S. ; Di Natale, G. ; Prinetto, P.

Author_Institution

Dipt. di Automatica e Informatica, Politecnico di Torino

Volume

1

fYear

2006

fDate

6-10 March 2006

Firstpage

1

Lastpage

6

Abstract

Static linked faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and makes test algorithm design a very complex task. A large number of March tests with different fault coverage have been published and some methodologies have been presented to automatically generate March tests. In this paper we present an approach to automatically generate March tests for static linked faults. The proposed approach generates better test algorithms then previous, by reducing the test length

Keywords

SRAM chips; automatic test pattern generation; fault simulation; integrated circuit design; logic design; logic testing; SRAM; automatic March tests generations; memory faults; static linked faults; test algorithm design; Access protocols; Algorithm design and analysis; Automatic testing; Computational modeling; Digital systems; Fault detection; Hardware; Random access memory; Semiconductor memory; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe, 2006. DATE '06. Proceedings

Conference_Location

Munich

Print_ISBN

3-9810801-1-4

Type

conf

DOI

10.1109/DATE.2006.244097

Filename

1657088