Title :
50+ Years of impedance measurement and spectroscopy, and implementation of virtual spectroscopy based on finite element analysis
Author :
Shilei Ma ; Boggs, Steven
Author_Institution :
Inst. of Mater. Sci., Univ. of Connecticut, Storrs, CT, USA
fDate :
January-February 2014
Abstract :
Impedance spectroscopy of dielectrics has a long history, going back to Heaviside. Modern multiphysics finite element analysis packages allow dielectric spectra to be computed from detailed physical models for comparison with measurements.
Keywords :
dielectric measurement; electric impedance measurement; finite element analysis; dielectric impedance spectroscopy; dielectric spectra; impedance measurement; multiphysics finite element analysis packaging; virtual spectroscopy; Capacitance; Current measurement; Dielectric measurement; Dielectrics; Frequency measurement; History; Spectroscopy; dielectric spectroscopy; impedance spectroscopy; time domain dielectric spectrometer;
Journal_Title :
Electrical Insulation Magazine, IEEE
DOI :
10.1109/MEI.2014.6701104
